تخصيص بهينه تجهيزات اندازه گيري كيفيت توان بر اساس ناحيه آسيبپذيري به منظور تعيين منشأ كمبود و بيشبود ولتاژ

The expansion of power systems and the increasing number of sensitive loads with advanced technologies in the power system have caused the Power Quality (PQ) issues more noticeable. The most common power quality problems are short-term disturbances, such as voltage sags and swells,that have asignificant impact on industrial and commercial customers.These phenomena often result from short-circuits in the system, leading to interruptions in sensitive equipment and process shutdowns. Restarting these processes may take hours and result in financial and economic losses. Therefore, one of the main reasons and most critical aspects of power quality problems is the economic issues caused by these phenomena for bothcustomers and the system. Considering short-circuit as the main resource of voltage sag and swell in the power system, measuring and recording these disturbances are important across the entire system to assessits functionality and the impact on customers. In addition, the challenge is to determine the fault location and the source of voltage sag/swell. In this regard, the proposed method deals with the placement of Power Quality Monitors (PQMs) toidentify the location of the faults in the system. In order to eva‎luate the propagation of the voltage sag throughout the system, the concept of Area of Vulnerability (AOV) is defined. Based on this, by considering the variousshort-circuit types in the system, the vulnerable area for the system buses is obtained. Subsequently, in the first stage of the proposed method, for each fault type, the locations of the PQMs are determined by solving the optimization problem. Since the placement schemes may not be unique, also due to the possibility of PQM failure, by considering one monitor failure scenario and by eva‎luating the percentage of fault location detection, the unique solution is chosen for each type of short-circuit. In the end, among the unique placements obtained in the second step, a configurationscheme is selected as the optimal PQM placementfor the entire system. The presented method is eva‎luated separately for voltage sag and voltage swell in the system and the optimal placement plan is determined for these two short-term phenomena. At last, with the aim of detecting the source of voltage sag and voltage swell, a scheme is selected as the optimal placement for the system that has the highest detection of the voltage sag and swell.The proposed method has been implemented on the well-known standard IEEE 9- and 30 bus systems and the simulation results demonstrate the effectiveness of the proposed algorithm in allocation ofPQMs for fault location detection.

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