RecordNumber
92411
Title
Digital systems testing and testable design
Author Statement
Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
Publication
Mumbai:Jaico
Publication Year
2001
Collation
xviii, 652p.: ill.
Notes
Originally published: New York: IEEE, c1990. , Main entry in original publication in under the first author.
Bibliography
Includes bibliographical references and index
Subject
Digital integrated circuits , Digital integrated circuits
ADDED ENTRIES
AU Breuer, Melvin A , TI
Main Class
621.
Sub Class
3815
Cutter no
A161d
واردكننده اطلاعات
شيرين السادات خليفه سلطاني