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RecordNumber
92411
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Title
Digital systems testing and testable design
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Author Statement
Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
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Publication
Mumbai:Jaico
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Publication Year
2001
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Collation
xviii, 652p.: ill.
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Notes
Originally published: New York: IEEE, c1990. , Main entry in original publication in under the first author.
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Bibliography
Includes bibliographical references and index
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Subject
Digital integrated circuits , Digital integrated circuits
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ADDED ENTRIES
AU Breuer, Melvin A , TI
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Main Class
621.
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Sub Class
3815
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Cutter no
A161d
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واردكننده اطلاعات
شيرين السادات خليفه سلطاني
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Link To Document :
