• RecordNumber
    58695
  • Author

    Lala, Parag K

  • Title

    Digital Circuit Testing and testability

  • Author Statement
    Parag K. Lala
  • Publication
    Academic
  • Publication Year
    c1997
  • Collation
    xii, 1990, ill, diagrs, tables
  • Bibliography
    Includes bibliographies
  • Subject

    Integrated circuits- Very large scale integration- Testing , Digital integrated circuits- Testing , Integrated circuits- Fault tolerance

  • Main Class
    621
  • Sub Class
    .395
  • Cutter no
    0287
  • Date
    L193d
  • وارد كنندة اطلاعات
    fazel^d// , faraz^d2003/04/29 09:49:09
    • Link To Document
    https://lib.ui.ac.ir/dl/search/default.aspx?Term=58695&Field=0&DTC=2