Digital systems testing and testable design

Author Statement

Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.

Edition

Rev. print.

Publication

IEEE Press

Publication Year

[1994], c1990

Collation

xviii, 652 p. : ill. ; 27 cm

Notes

Includes bibliographical references and index

Subject

Digital integrated circuits- Testing , Digital integrated circuits- Design and construction

ADDED ENTRIES

Breuer, Melvin A. , Friedman, Arthur D.

Main class

621.

Sub class

381

Cutter no

A161d

ISBN

0780310624

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