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RecordNumber
643
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Author
Sachdev, Manoj
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Title
Defect-oriented testing for nano-metric CMOS VLSI circuits
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Author Statement
by Manoj Sachdev and José Pineda de Gyvez
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Edition
2nd ed.
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Publication
Springer
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Publication Year
c2007
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Collation
xxi, 328 p. : ill.
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Series
Frontiers in electronic testing
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Notes
New edition of: Defect oriented testing for CMOS analog and digital circuits, 1998
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Subject
Metal oxide semiconductors, Complementary -- Testing , Metal oxide semiconductors, Complementary -- Defects , Integrated circuits -- Very large scale integration -- Testing , Integrated circuits -- Very large scale integration -- Defects
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ADDED ENTRIES
Pineda de Gyvez, José.
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Main class
621.
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Sub class
38152
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Cutter no
S121d
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ISBN
978-0-387-46547-0
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Link To Document :
