Defect-oriented testing for nano-metric CMOS VLSI circuits

Author Statement

by Manoj Sachdev and José Pineda de Gyvez

Edition

2nd ed.

Publication

Springer

Publication Year

c2007

Collation

xxi, 328 p. : ill.

Series

Frontiers in electronic testing

Notes

New edition of: Defect oriented testing for CMOS analog and digital circuits, 1998

Subject

Metal oxide semiconductors, Complementary -- Testing , Metal oxide semiconductors, Complementary -- Defects , Integrated circuits -- Very large scale integration -- Testing , Integrated circuits -- Very large scale integration -- Defects

ADDED ENTRIES

Pineda de Gyvez, José.

Main class

621.

Sub class

38152

Cutter no

S121d

ISBN

978-0-387-46547-0

Link To Document