Thin film analysis by X-ray scattering

Author Statement

Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel.

Publication

Wiley-VCH

Publication Year

c2006

Collation

xxii, 356 p. ill.

Notes

Includes bibliographical references and index

Subject

Thin films. , X-ray spectroscopy.

ADDED ENTRIES

Fewster, Paul F. , Genzel, Christoph.

Main class

530.

Sub class

4275

Cutter no

B619t

ISBN

978-3-527-31052-4

Link To Document